Recent & Upcoming Talks | Joshua Taillon

2024

HyperSpy: Your Multidimensional Data Analysis Toolbox

Jul 11, 2024 Tacoma, WA

Updates from the MaRDA LIMS Working Group -- A Community Discussion

Apr 22, 2024 Seattle, WA

An update from the MaRDA LIMS Working Group

Feb 21, 2024 Virtual

2023

Lessons Learned Building a Modern Microscopy Data Infrastructure at NIST

Oct 31, 2023 Munich, Germany

Introducing the MaRDA LIMS Working Group: LIMS Schema Development

Oct 24, 2023 Salzburg, Austria

Lessons Learned Evaluating and Deploying Electronic Laboratory Notebooks at NIST

Sep 12, 2023 Virtual (Munich, Germany)

An Overview of the NIST Microscopy Data Ecosystem

May 3, 2023 Evanston, IL

Overview of NexusLIMS Usage and Development

May 1, 2023 Evanston, IL

2022

Lessons Learned Building a Modern Microscopy Data Infrastructure at NIST

Oct 28, 2022 Denver, CO

Lessons Learned Building a Modern Microscopy Data Infrastructure at NIST

Oct 17, 2022 Virtual (Madison, WI)

Lessons Learned Building a Modern Microscopy Data Infrastructure at NIST

Sep 9, 2022 Virtual (Richland, WA)

Lessons Learned in Building a Modern Microscopy Data Infrastructure at NIST

Aug 3, 2022 Portland, OR

Data Analysis in Materials Science

Jul 31, 2022 Portland, OR

2021

Open-source hyper-dimensional materials analytics using HyperSpy

Oct 17, 2021 Virtual

Data Analysis in Materials Science

Aug 1, 2021 Virtual

2020

NexusLIMS: Leveraging Shared Microscopy Resources for Data Analysis with a Configurable Laboratory Information Management System

Aug 6, 2020 Virtual

2019

Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management System

Aug 6, 2019 Portland, OR

Short Course: Data Analysis in Materials Science

Aug 4, 2019 Portland, OR

Electron Microscopy in the Age of Big Data

Jun 5, 2019 Hamilton, ON, Canada

2018

Compressive Sensing Reconstruction for EDS Analysis

Aug 8, 2018 Baltimore, MD

An Open Evaluation of Hyperspectral Unmixing Strategies for EDS Analysis

Aug 8, 2018 Baltimore, MD

Applications of Compressive Sensing for EDS Analysis

Apr 8, 2018 Hamilton, ON, Canada

An Introduction to HyperSpy: the Multi-dimensional Data Analysis Toolbox

Apr 5, 2018 Gaithersburg, MD

2017

Computational Frontiers in Microscopy and Microanalysis

Sep 15, 2017 Gaithersburg, MD

Compressed Sensing Applications in Microscopy and Microanalysis

May 18, 2017 Gaithersburg, MD

TEM-EELS Investigation of Boron and Phosphorus Passivated 4H-SiC/SiO$_\sf{2}$ Interface Structures

Mar 15, 2017 New Orleans, LA

Quantifiable Comparative Evaluation of FIB/SEM Instruments

Mar 2, 2017 Gaithersburg, MD

2016

Analytical and Microstructural Microscopy Approaches for Materials Characterization

Dec 13, 2016 Adelphi, MD

Analytical Electron Microscopy of Interfacial States in 4H-SiC/SiO$_\sf{2}$ MOS Devices

Nov 30, 2016 Boston, MA

(Award Presentation) Analytical Electron Microscopy of Interfacial States in 4H-SiC/SiO$_\sf{2}$ MOS Devices

Nov 29, 2016 Boston, MA

Advanced Analytical Microscopy at the Nanoscale: Applications in Wide Bandgap and Solid Oxide Fuel Cell Materials

Jul 8, 2016 College Park, MD

Performance and Degradation of SOFC Cathodes at Reduced Temperature

May 31, 2016 San Diego, CA

Revealing Hidden Interfacial States in NO Passivated 4H-SiC/SiO$_\sf{2}$ Structures using TEM-EELS and XPS

Mar 18, 2016 Baltimore, MD

Alloyed Noble Metal Nanoparticles with Tunable Optical Properties

Mar 14, 2016 Baltimore, MD

2015

Probing the Nature of Interfacial States in NO Passivated 4H-SiC/SiO$_\sf{2}$ Structures using TEM-EELS and XPS

Dec 2, 2015 Boston, MA

Tomographic and Hyperspectral Analysis of Porous Three-Dimensional Solid Oxide Fuel Cell Cathodes at Multiple Length Scales

Nov 30, 2015 Boston, MA

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$_\sf{2}$ MOS Structures Using TEM and XPS

Aug 13, 2015 College Park, MD

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM

Aug 6, 2015 Portland, OR

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$_\sf{2}$ Structures Using TEM and XPS

Aug 5, 2015 Portland, OR

Investigating the Relationship between Operating Conditions and SOFC Cathode Degradation

Jul 28, 2015 Glasgow, Scotland

Three Dimensional Microstructural Characterization of SOFCs Using Focused Ion Beam and SEM

Feb 25, 2015 Laurel, MD

2014

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$_\sf{2}$ Structures Using TEM and XPS

Dec 3, 2014 Boston, MA

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM

Oct 2, 2014 Boston, MA

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$_\sf{2}$ Structures Using TEM and XPS

Aug 14, 2014 College Park, MD

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM

May 13, 2014 Orlando, FL

2013

Characterization of the Oxide-Semiconductor Interface in NO, P, and N-plasma Passivated 4H-SiC/SiO$_\sf{2}$ Structures Using TEM and XPS

Dec 4, 2013 Boston, MA

Characterization of the Oxide-Semiconductor Interface in NO, P, and N-plasma Passivated 4H-SiC/SiO$_\sf{2}$ Structures Using TEM

Aug 22, 2013 College Park, MD

Characterization of the Oxide-Semiconductor Interface in NO, P, and N-Plasma Passivated 4H-SiC/SiO$_\sf{2}$ Structures Using TEM

Jun 26, 2013 South Bend, IN

Characterization of the oxide-semiconductor transition layer in NO, P, and N-plasma passivated 4H-SiC/SiO$_\sf{2}$ structures using transmission electron microscopy

Mar 18, 2013 Baltimore, MD

2012

Systematic Characterization of the SiC/SiO$_\sf{2}$ Transition Layer in NO-Annealed MOSFETs

Nov 29, 2012 Boston, MA

Fabrication of ZnO Nanowire Arrays for Hybrid Photovoltaic Applications (poster)

Nov 26, 2012 Boston, MA

Systematic Characterization of the SiC/SiO$_\sf{2}$ Transition Layer in NO-Annealed MOSFETs

Aug 16, 2012 College Park, MD

Fabrication of ZnO Nanowire Arrays for Hybrid Photovoltaic Applications

Feb 28, 2012 Boston, MA

2011

Ab Initio Discovery of Novel Crystal Structure Stability in Barium and Sodium-Calcium Compounds under Pressure using DFT

May 18, 2011 Ithaca, NY