Joshua Taillon
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Systematic Characterization of the SiC/SiO$_\sf{2}$ Transition Layer in NO-Annealed MOSFETs
Project
Slides
Date
Nov 29, 2012
Event
2012 Fall Materials Research Society Meeting
Location
Boston, MA
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Fabrication of ZnO Nanowire Arrays for Hybrid Photovoltaic Applications (poster)
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Characterization of the oxide-semiconductor transition layer in NO, P, and N-plasma passivated 4H-SiC/SiO$_\sf{2}$ structures using transmission electron microscopy
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