Systematic Characterization of the SiC/SiO $_{2}$ Transition Layer in NO-Annealed MOSFETs

Name: Systematic Characterization of the SiC/SiO$_\sf{2}$ Transition Layer in NO-Annealed MOSFETs
Start: 2012-08-16T00:00:00Z
Location: College Park, MD

Project Slides

Date

Aug 16, 2012

Event

7^th Annual SiC MOS Workshop

Location

College Park, MD

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Systematic Characterization of the SiC/SiO2 Transition Layer in NO-Annealed MOSFETs

Systematic Characterization of the SiC/SiO $_{2}$ Transition Layer in NO-Annealed MOSFETs