Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM

Name: Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM
Start: 2014-05-13T00:00:00Z
Location: Orlando, FL

Project Slides

Date

May 13, 2014

Event

2014 Spring Electrochemical Society Meeting

Location

Orlando, FL

Joshua Taillon

Materials Data Scientist

A materials research scientist at NIST interested in scientific data curation, AI for materials research, and baking bread.