Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM


Date
May 13, 2014
Location
Orlando, FL

This browser does not support inline PDFs. Please download the PDF to view it: Download PDF

Avatar
Joshua Taillon
Materials Data Scientist

A materials research scientist at NIST interested in scientific data curation, AI for materials research, and baking bread.

Previous
Next