Joshua Taillon
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Three Dimensional Microstructural Characterization of SOFCs Using Focused Ion Beam and SEM
Project
Slides
Date
Feb 25, 2015
Event
2015 FIB/SEM User Group Meeting
Location
Laurel, MD
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Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$_\sf{2}$ Structures Using TEM and XPS
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Investigating the Relationship between Operating Conditions and SOFC Cathode Degradation
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