Three Dimensional Microstructural Characterization of SOFCs Using Focused Ion Beam and SEM

Name: Three Dimensional Microstructural Characterization of SOFCs Using Focused Ion Beam and SEM
Start: 2015-02-25T00:00:00Z
Location: Laurel, MD

Project Slides

Date

Feb 25, 2015

Event

2015 FIB/SEM User Group Meeting

Location

Laurel, MD

Joshua Taillon

Materials Data Scientist

A materials research scientist at NIST interested in scientific data curation, AI for materials research, and baking bread.