Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM

Name: Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM
Start: 2015-08-06T00:00:00Z
Location: Portland, OR

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Date

Aug 6, 2015

Event

2015 Microscopy and Microanalysis Meeting

Location

Portland, OR

Joshua Taillon

Materials Data Scientist

A materials research scientist at NIST interested in scientific data curation, AI for materials research, and baking bread.