Probing the Nature of Interfacial States in NO Passivated 4H-SiC/SiO$_\sf{2}$ Structures using TEM-EELS and XPS

Name: Probing the Nature of Interfacial States in NO Passivated 4H-SiC/SiO$_\sf{2}$ Structures using TEM-EELS and XPS
Start: 2015-12-02T00:00:00Z
Location: Boston, MA