Revealing Hidden Interfacial States in NO Passivated 4H-SiC/SiO$_\sf{2}$ Structures using TEM-EELS and XPS

Name: Revealing Hidden Interfacial States in NO Passivated 4H-SiC/SiO$_\sf{2}$ Structures using TEM-EELS and XPS
Start: 2016-03-18T00:00:00Z
Location: Baltimore, MD

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