Joshua Taillon
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Analytical Electron Microscopy of Interfacial States in 4H-SiC/SiO$_\sf{2}$ MOS Devices
Project
Slides
Date
Nov 30, 2016
Event
2016 Fall Materials Research Society Meeting
Location
Boston, MA
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(Award Presentation) Analytical Electron Microscopy of Interfacial States in 4H-SiC/SiO$_\sf{2}$ MOS Devices
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Analytical and Microstructural Microscopy Approaches for Materials Characterization
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