TEM-EELS Investigation of Boron and Phosphorus Passivated 4H-SiC/SiO$_\sf{2}$ Interface Structures

Name: TEM-EELS Investigation of Boron and Phosphorus Passivated 4H-SiC/SiO$_\sf{2}$ Interface Structures
Start: 2017-03-15T00:00:00Z
Location: New Orleans, LA

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